Products : Test Systems for LED
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LED epi Wafer EL Tester
1. Feature * Generation of virtual LED on Epi-wafer without any FAB process * Direct Probing on Epi-wafer surface * Non-destructive and Non-contamination * Wafer-level characterization (both optical and electrical properties) * Nearly ohmic contact prober on the surface & edge of Epi-wafer without any damage 2. Specification * Measuring the exact light intensity, spectrum and electric properties of Epi-wafer * Auto testing by programmed map point using an automatic X-Y-Z stage operation * Auto Loading/Unloading by robot (option) * Simultaneously detecting the spectrum from top and bottom side of Epi-wafer (option) * Providing various measurement items, correlation and graphical data 3. Measurement Data * Optical Power * FWHM/ Dominant/ Peak/ Center wavelength * Spectrum curve * Forward / Reverse voltage & current * L-I-V sweep characteristics * Chromaticity x, y etc. |
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Real Time Multi Channel LED Aging & Tj System * Measuring(in situ) the relative value of light output degradation and voltage fluctuations of the sample LED * Measuring(in situ) the Thermal resistance & Tj for multi-channel sample LED * Measuring the Tj based on the Dynamic mode (transient mode) method * Applying an algorithm to calculate the correct k-factor * Can be analyzed the correlated data between the test results of Aging and the Junction temperature * Prediction of static degradation characteristics as the V-I sweep and low current test |
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In situ Multi Channel LED Aging System
1. Feature * Accelerated Life time Test system for high-power LED package can measure in-situ data under the temperatures of up to 100℃ and current of up to 2,000mA * A Tray is configured with a 12ch of LED fixture that can be expanded as 12ch unit and controled the temperature & current of each fixture independently * Using a high-precision Sourcemeter, the change of DC characteristics can be observed as DC test under the aging test of LED. * The V-I sweep data can also be measured as optional conditions 2. Specification * Temperature - LED unit : +25℃~ +100℃ (Resolution : ±0.1℃) - PD unit : +40℃ constant (Resolution : ±0.1℃) - Temp. control : TEC & Cooling FAN * LED Driver - Current Range : 0 ~ 2000mA (CW and Pulse) - Voltage : 0 ~ ±10V - Driving Method : ACC (Automatic Current Control) - PD Power Range : 0~W (using attenuator * Measurement Items - Current, Voltage, Optical Power, Temperature - DC Test & V-I Sweep (option) : max. 20-points |
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LM80 System * Lumen Maintenance Testing system of LED light sources based on the international standards LM-80 * System configurations : Chamber and Thermal plate types * Temperature : 1) Case temperature : 55℃, 85℃, one selected by manufacturer 2) Temperature control : <-2℃ 3) Ambient temp. : <-5℃ of case temperature * Electrical Condition 1) Ripple voltage : < 2% of DC output voltage 2) Voltage : Total harmonic distortion < 3% 3) LED driving (option) : - Individual control method (2A, 10V/ch) - Series control method (2A, 100~300V/ch * The integrating sphere test system can be provided based on LM-79 standard (option) |
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LED Module Tester 1. Feature * Automatic test system for measuring the various electro optical properties of LED bars or modules mounted on Thermal Stage which is set of selected temperature. * Electricl and Optical characteristics of multi channel LED can be measured in individually or modular base using by the multi Sourcemeter and Switching unit * Reliable and High-speed measurement is possible using by the Spectrometer can be changed of ND filter and Integration time automatically in accordance with the light output * Enhance the measured data reliability with automatic alignment function of the high reliable image processing for the measurement location as the correct moving by the adopted high-speed and high- precision Linear Motor 2. Specification * Thermal Stage Size : 300 x 700mm * Temperature Range : 25℃ ~ +85℃ (Resolution :± 0.1℃) 1) Uniformity@Full area : ±1℃ 2) Control : TEC & Chilled Water * Measurement Items 1) Forward/Reverse Current, Forward/Reverse Voltage, Optical Power, Sample temperature 2) Luminous Intensity, Dominant Wavelength, Color Coordinates, CCT, CRI, etc. |
 
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LED Chamber Aging & Auto Tester * 100ch LED packages loaded on Aging Board, Aging Test in Chamber, and Auto Measurement in test system with board to board level by Automatic Robot System * Chamber is capable of aging test with 600ch LED Package * Productivity and Reliability Improvement due to Aging Test and Test System separated * None of operator’s manual handling decreases defect rate of LED * Reliable Test Data by CIE Averaged Luminous Intensity Barrel * Able to measure for various LED packages by changing a aging board * Spectrometer & LED Sourcemeter changeable by customer’s specific needs * Aging System - No. of samples : 100ch, 300ch, 600ch, 1200ch - Temperature range : 50℃ ~ 120℃ (Humidity : option) - Current Range : 0 ~ 2000mA/ch - Voltage Range : 0 ~ 5V/ch |