Products : Test Systems for LD
  
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TOSA/BOSA LD I-V-L Tester * Package type : TOSA/BOSA LD Φ5.6 TO CAN or Box * No. of Test Samples : 15pcs/Fixture * Current/Voltage Range : 0~1000mA / 0~9V * Detector : 1-Photodiode on X-Y moving stage * Temperature Range : 25℃ ~ 85℃ * Measurement Items 1) I-V-L Sweep Test 2) Spectrum Test 3) Tracking Error Test etc. |
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LD Bar Tester * This system is designed to measure optical & electrical properties of LD chip, chipbar and CAN type package at various temperature ranges. * Very compact and desktop sized system * Configured for R&D and quality control in production line. * Sample types : LD Bar, LD Chip, TO CAN PKG, etc. * Measurement Item : LIV Sweep, FFP, Spectrum * Two Detectors : Long Wavelength (1000~1600nm) or Short Wavelength(400~1000nm) * Temperature Control : 25℃ ~ 85℃ * Test Driver : 1A/5V, Pulse(Min. Pulse Width 1usec-Option) * Position alignment of samples by Vision Processing |
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TO CAN Burn-In Tester * Burn-in System for various TO CAN LD packages * Sample types : 3, 4, 5, 7, 8, 9 pin LD TO CAN package * No. of Measurement Samples : 500-samples / chamber * Burn-in Board : 100-samples loading on board * Measurement Item : Burnin Current/Voltage, mPD current and Chamber Temperature * Current / Voltage Range : 0~300mA / 0~3V * Temperature Control : 50℃ ~ 120℃ (option:25~120℃)
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LD TO CAN Characteristics Test System * Test Board : You can use the burn-in board as it is * No. of Measurement Samples : 100 samples/board * Measurement Item 1) L-I-V measurement 2) Spectrum measurement 3) FFP measurement(option) 4) Test Temperature * Current Range : 0~1000mA(CW) * Voltage Range : 0~9V * Board Temperature Control : 25℃ ~ 100℃ * In-TEC Temperature Control : option |
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CoC Type LD Burn-in Tester * Sample type : CoC type * No. of Measurement Samples : 100 samples/chamber * Burn-in Fixture : 10-samples on board * Measurement Item - Burnin Current/Voltage, - EAM Bias - Chamber Temperature * Current Range : 0~500mA * Voltage : 0~9V * Temperature Control : 50℃ ~ 120℃ (option:25~120℃) |
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CoC Type LD Characteristics Test System * Test Fixture : You can use the CoC burn-in fixture as it is * No. of Measurement Samples : 10-samples/fixture * Measurement Item 1) L-I-V measurement 2) Spectrum measurement 3) FFP measurement(option) 4) Test Temperature * Current Range : 0~1000mA(CW) * Voltage Range : 0~9V * Board Temperature Control : 25℃ ~ 100℃ * Spectrum Measurement for Fiber Auto Alignment by Peak Search Algorithm |
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VCSEL Burn-in Tester * Sample type : VCSEL TO Package * No. of Measurement Samples : 500-samples/chamber * Burn-in Fixture 1) 100-samples on board 2) Slot Interface * Measurement Item * Burn-in Current/Voltage, mPD Current and Chamber Temperature * FFP (option) * Current Range : 0~250mA * Voltage Range : 0~3V * Current Resolution : 0.01mA * Temperature Control : 50℃ ~ 120℃ (option:25~120℃) |
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VCSEL Characteristics Test System * Test Board : You can use the VCSEL burn-in fixture as it is * No. of Measurement Samples : 100-samples/board * Measurement Item 1) L-I-V measurement 2) Spectrum measurement 3) FFP measurement(option) 4) Test Temperature * Current: 0~500mA(CW) * Voltage Range : 0~9V * Board Temperature Control : 25℃ ~ 100℃ |
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High Power VCSEL Burn-in Tester * Test Package : High Power VCSEL on Metal PCB * No. of Measurement Samples : 16-samples * Current Range : 0 ~ 12A/ch * Voltage Range : 0 ~ 50V/ch * Current Mode : CW and Pulse * Measurement Method : Optical Power and Spectrum measurement with integrating sphere on X-Y moving stages * Tempetature control : TEC * Temperature Range : 50℃ ~ 100℃ * Measurement Item 1) Current 2) Voltage 3) Optical Power 4) TEC Temperature 5) Burn-in Time |
 
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Butterfly LD Burn-In Tester * Burn-In system for high power 14pin Butterfly LD Package supplying up to +85℃ and 2A * Optical measurement system for Fiber Pigtailed LD Module * Very stable and precise temperature control by TEC * Keeping temperature of PD detector for reliable detection * L-I-V sweep measuring in the middle of Burn-In test * Able to measure high optical power using special optics * Test Samples : 14pin Butterfly or TO220 Package * Burn-in Temperature : 25℃ ~ 85℃ * No. of Test Samples : 36-samples * Current / Voltage Range : 0~2A / 0~5V |
  
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High Power LD Characteristic Test System * PKG : CS-mount, C-mount , micro-channel * Package Application : Millitary, Bio, Machining etc. * Measurement Item : LIV Sweep, FFP, NFP, Spectrum * Can be observed of the variation of LD properties under various temperature environments * Current : CW + Pulse (150A, 20V) * Optical Power : 0 ~ 3KW(thermopile sensor) |